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Simulation of Electron Spectra for Surface Analysis (SESSA)

By Wolfgang Werner, Werner Smekal and Cedric Powell.

SESSA is a unique tool for researchers active in the field of surface and interface analysis. It allows a user to retrieve data relevant for a specific electron spectroscopy experiment in a matter of a few mouseclicks and, in addition, it provides simulated spectra that can be compared with experimental data to gain information on the specimen structure.

Download a free demo version of SESSA here

Sessa Startup Screen

  • The official release of SESSAI by NIST took place on Dec. 22 2005. Visit the NIST SESSA-Website to order a copy of this software

  • For a quick guide through SESSA's unique features, click here

  • For some applications of the SESSA software click here

  • Learn more about the features of this software by downloading the user's guide (pdf, 300kB).

To obtain a copy of this Software visit the NIST SESSA-Website and click on the fax- or mail-order form link.

The (old) homepage for SESSA testers is still online. Registered testers can reach it by clicking here

Research groups interested in testing SESSA for new applications in cooperation with us should contact one of the authors Wolfgang Werner, Werner Smekalor Cedric Powell.

SESSA can be used for two main applications. First, data are provided for many parameters needed in quantitative AES and XPS (differential inverse inelastic mean free paths, total inelastic mean free paths, differential elastic-scattering cross sections, total elastic-scattering cross sections, transport cross sections, photoelectric cross sections, photoelectric asymmetry parameters, electron-impact ionization cross sections, photoelectron lineshapes, Auger-electron lineshapes, fluorescence yields, and Auger-electron backscattering factors). Second, Auger-electron and photoelectron spectra can be simulated for layered samples. The simulated spectra, for layer compositions and thicknesses specified by the user, can be compared with measured spectra. The layer compositions and thicknesses can then be adjusted to find maximum consistency between simulated and measured spectra.

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